+2019-04-17 H.J. Lu <hongjiu.lu@intel.com>
+
+ PR ld/24458
+ * testsuite/ld-x86-64/x86-64.exp: Run PR ld/24458 tests.
+ * testsuite/ld-x86-64/pr24458.s: New file.
+ * testsuite/ld-x86-64/pr24458a-x32.d: Likewise.
+ * testsuite/ld-x86-64/pr24458a.d: Likewise.
+ * testsuite/ld-x86-64/pr24458b-x32.d: Likewise.
+ * testsuite/ld-x86-64/pr24458b.d: Likewise.
+ * testsuite/ld-x86-64/pr24458c-x32.d: Likewise.
+ * testsuite/ld-x86-64/pr24458c.d: Likewise.
+
+2019-04-17 Jozef Lawrynowicz <jozef.l@mittosystems.com>
+
+ * config/tc-msp430.c (msp430_make_init_symbols): Define __crt0_init_bss
+ symbol when .lower.bss or .either.bss sections exist.
+ Define __crt0_movedata when .lower.data or .either.data sections exist.
+ * testsuite/gas/msp430/either-data-bss-sym.d: New test.
+ * testsuite/gas/msp430/low-data-bss-sym.d: New test.
+ * testsuite/gas/msp430/either-data-bss-sym.s: New test source.
+ * testsuite/gas/msp430/low-data-bss-sym.s: New test source.
+ * testsuite/gas/msp430/msp430.exp: Run new tests.
+ Enable large code model when running -mdata-region={upper,either}
+ tests.
+
+2019-04-16 Alan Modra <amodra@gmail.com>
+
+ * testsuite/ld-scripts/pr20302.d: Don't run for ns32k-*-*.
+ * testsuite/ld-scripts/section-match-1.d: Likewise.
+ * testsuite/ld-undefined/require-defined.exp: Likewise.
+
+2019-04-15 Faraz Shahbazker <fshahbazker@wavecomp.com>
+
+ * testsuite/ld-gc/gc.exp: Skip print-map-discarded test for non-ELF
+ targets.
+
+2019-04-15 Sudakshina Das <sudi.das@arm.com>
+
+ * testsuite/ld-arm/bfcsel.s: New.
+ * testsuite/ld-arm/bfcsel.d: New.
+ * testsuite/ld-arm/arm-elf.exp: Add above test.
+
+2019-04-15 Sudakshina Das <sudi.das@arm.com>
+
+ * testsuite/ld-arm/bfl.s: New.
+ * testsuite/ld-arm/bfl.d: New.
+ * testsuite/ld-arm/arm-elf.exp: Add above test.
+
+2019-04-15 Sudakshina Das <sudi.das@arm.com>
+
+ * testsuite/ld-arm/bf.s: New.
+ * testsuite/ld-arm/bf.d: New.
+ * testsuite/ld-arm/arm-elf.exp: Add above test.
+
2019-04-15 Thomas Preud'homme <thomas.preudhomme@arm.com>
* testsuite/ld-arm/attr-merge-13.attr: New test.