static
bt_component_class_initialize_method_status src_init(
bt_self_component_source *self_comp,
- bt_self_component_source_configuration *config,
- const bt_value *params, void *init_method_data)
+ bt_self_component_source_configuration *config __attribute__((unused)),
+ const bt_value *params __attribute__((unused)),
+ void *init_method_data __attribute__((unused)))
{
test_example_scenario(self_comp);
return BT_COMPONENT_CLASS_INITIALIZE_METHOD_STATUS_OK;
static
bt_message_iterator_class_next_method_status src_iter_next(
- bt_self_message_iterator *self_iterator,
- bt_message_array_const msgs, uint64_t capacity,
- uint64_t *count)
+ bt_self_message_iterator *self_iterator __attribute__((unused)),
+ bt_message_array_const msgs __attribute__((unused)),
+ uint64_t capacity __attribute__((unused)),
+ uint64_t *count __attribute__((unused)))
{
return BT_MESSAGE_ITERATOR_CLASS_NEXT_METHOD_STATUS_ERROR;
}
* External tools (e.g. valgrind) should be used to confirm that this
* known-good test does not leak memory.
*/
-int main(int argc, char **argv)
+int main(void)
{
/* Initialize tap harness before any tests */
plan_tests(NR_TESTS);